[Radiance-general] FYI - Columbia-Utrecht Reflectance and Texture Database

Daniel Matthews [email protected]
Sun, 4 Aug 2002 11:42:13 +1000


http://www.cs.columbia.edu/CAVE/curet/

Columbia-Utrecht Reflectance and Texture Database 


 Kristin J. Dana 
Bram Van Ginneken 


 Shree K. Nayar 
Jan J. Koenderink 



 Researchers at Columbia University and Utrecht University have collaborated 
in an extensive investigation of the visual appearance of real-world 
surfaces. This joint effort, sponsored in part by REALISE of the European 
Commission, the National Science Foundation and by DARPA/ONR under the MURI 
Grant No. N00014-95-1-0601 has resulted in 3 databases: 

 BRDF (bidirectional reflectance distribution function) database with 
reflectance measurements for over 60 different samples, each observed with 
over 200 different combinations of viewing and illumination directions. 
 BRDF parameter database with fitting parameters from two recent BRDF models: 
the Oren-Nayar model and the Koenderink et al. representation. These BRDF 
parameters can be directly used for both image analysis and image synthesis. 
 BTF (bidirectional texture function) database  with image textures from over 
60 different samples, each observed with over 200 different combinations of 
viewing and illumination directions. Each of these databases is made publicly 
available for research purposes. For details about the measurements, and 
fitting procedures a technical report and summary paper are provided. Also 
see the following journal paper: 

Reflectance and Texture of Real World Surfaces, K.J. Dana, B. van Ginneken, 
S.K. Nayar and J. J. Koenderink, 
ACM Transactions on Graphics, Volume 18, No. 1, pp. 1-34, January 1999